Abstract

In this work, Cu_1-xIn_xSe₂ thin films have been grown on heated glass substrates using chemical spray pyrolysis. Characterizations and compositional analysis of Cu_1-xIn_xSe₂ thin films were obtained by X-ray Diffraction (XRD) and Electron Dispersion Analysis (EDX). Microstructure parameters as a function of Cu/ In and the substrate temperature (Tsub) in the range of 548K to 623K have been study. Williamson-Hall method has been used to determine the crystallite size, microstrain. XRD revealed that a polycrystalline CuInSe2 thin films with the hexagonal structure having preferential growth along the <002> direction. At the Cu/In ratio increased, improved of the degree of crystallinity and decrement of both, the lattice parameters and volume of unit cell. Also, the crystallite size was found to be increased and decreased with the growth temperature. On the contrary, the microstrain values were decreasing with the growth temperature and Cu/In ratio were increasing.

Keywords: Spray pyrolysis; X-ray diffraction; CuInSe2 thin films