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Abstract
Advances in Complementary & Alternative medicine
Application of Double-Crystal X-Ray Difractometry Methods and Topography for Characterization of Isotopically Modified CVD Diamond Films
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Open or CloseRomanov DA* and Kosushkin VG
Bauman Moscow State Technical University Kaluga Branch, Russia
*Corresponding author: Romanov DA, Bauman Moscow State Technical University Kaluga Branch, Russia
Submission: March 08, 2021; Published: March 25, 2021
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Volume1 Issue5
Abstract
The case of studying isotopically modified CVD diamond films the high efficiency of using of doublecrystal x-ray diffractometry and topography methods for characterizing crystals while improving the technology for their growth has been demonstrated. The main structural defects (dislocations, stacking faults, second-phase inclusions, etc.) that occur in synthetic diamond crystals during their preparation have been identified.
Keywords: Double-crystal x-ray diffractometry; X-ray topography; Defects in the crystal structure; Epitaxial films; Isotopically modified films
Abbreviations: XRD: X-Ray Diffractometry; MDs: Misfit Dislocations; ES: epitaxial structurese
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